Overview
Call for Papers
Important Dates
Keynote Speakers
Program
Chairs & Committees
Submission

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5th International Conference on Tests & Proofs
Zurich, June 30 - July 01, 2011
Part of the TOOLS Federated Conferences 2011
Program
Thursday, 09:00-10:30: Invited Talk
Thursday, 11:00-13:00: TAP4TOOLS & TOOLS4TAP
[Joint TOOLS and TAP session: additionally 2 papers from TOOLS]
- Omar Chebaro, Nikolay Kosmatov, Alain Giorgetti and Jacques Julliand:
The SANTE Tool: Value Analysis, Program Slicing and Test Generation for C Program Debugging
- Claire Dross, Yannick Moy and Jean-Christophe Filliâtre:
Correct Code Containing Containers
Thursday, 14:30-15:30: Structural TAP
- Renzo Degiovanni, Pablo Ponzio, Nazareno Aguirre and Marcelo Frias:
Abstraction based Automated Testing from Formal Tabular Requirements Specifications
- Nazareno Aguirre, Valeria Bengolea, Marcelo Frias and Juan Galeotti:
Incorporating Coverage Criteria in Bounded Exhaustive Black Box Test
Generation of Structural Inputs
Thursday, 16:00-17:00: TAP on Models
- Mathias Soeken, Robert Wille and Rolf Drechsler:
Encoding OCL Data Types for SAT-based Verification of UML/OCL Models
- Pierre-Christophe Bue, Jacques Julliand and Pierre-Alain Masson:
Association of Under-Approximation Techniques for Generating Tests
From Models
Friday, 11:00-12:00: Invited Talk
Friday, 12:00-13:00: TAP for Security and Networks
- Matthias Büchler, Johan Oudinet and Alexander Pretschner:
Security Mutants for Property-Based Testing
- Javier Troya, Jose Bautista, Fernando López-Romero and Antonio Vallecillo:
Lightweight Testing of Communication Networks with e-Motions
Friday, 14:30-15:30: TAP for Reactive and Web Systems
- Karl Meinke and Muddassar Sindhu:
Incremental Learning-Based Testing for Reactive Systems
- Lina Bentakouk, Pascal Poizat and Fatiha Zaidi:
Checking the Behavioral Conformance of Web Services with Symbolic
Testing and SMT Solver
Friday, 16:00-17:00: Random and Specification-based TAP
- Pierre-Cyrille Heam and Catherine Masson:
A Random Testing Approach Using Pushdown Automata
- Li Tan:
State Coverage Metrics for Specification-Based Testing with Büchi Automata
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